神经精神类疾病是全球致残率极高的疾病类别之一，已影响约9.7亿人口，给患者及其家庭带来了沉重的负担。以帕金森病为例，其发病率随年龄增长显著增加，传统药物治疗虽能缓解部分症状，但长期使用效果递减且副作用显著。脑深部电刺激通过植入式神经刺激器对大脑特定区域进行电刺激，显著改善p帕金森病患者的运动功能障碍。电荷泵芯片是植入式神经刺激器的核心部件之一，负责将低电压电源转换为高压电源。因此，开发高效、准确且低成本的电荷泵芯片测试系统对于确保植入式神经刺激器的安全性和可靠性具有重要意义。本研究详细探讨了电荷泵芯片的功能性能测试，功能测试涵盖倍压输出、脉冲频率、负载能力、功耗效率和关闭漏电流五个维度，通过模拟不同工况输入条件，测试芯片各项功能指标。此外，基于人体模型和充电器件模型的静电测试结果表明，所有芯片样本均符合静电防护标准。芯片的功能性能测试结果为后续自动测试系统开发提供了关键数据支撑。针对传统测试效率不足的问题，本研究进一步构建基于自动测试机的芯片自动测试系统。系统整合了引脚测试、逻辑测试和功能测试等流程，通过类别板实现芯片与测试设备的精准连接，集成可调电阻负载模拟真实工作状态，实现了精准测量。相比传统手工测试，单个芯片测试时间从25 min缩减至30 s，成功构建了高效准确的自动化电荷泵芯片测试系统，确保其在植入式神经刺激器中的安全性和可靠性。为降低测试成本，本文设计了基于nRF52832微控制器的自研自动测试系统。硬件部分采用三档电源管理（2.3 V/3.3 V/4.1 V）适配不同电压需求，通过倍压分压电路与脉冲频率比较器实现参数测量；软件部分构建了嵌入式数据采集与上位机可视化界面，支持研发与生产双模式切换。该方案使单台测试设备成本降低约90\%，为多样化生产需求提供了经济高效的解决方案。本研究深入探讨了电荷泵芯片的测试方法，并成功建立了自动测试系统。该系统不仅显著提升了测试效率，还极大降低了测试成本，对于确保植入式神经刺激器的安全性和可靠性具有重要意义。
Neuropsychiatric disorders, such as Parkinson’s disease, Alzheimer’s disease, and depression, are among the most disabling disease categories globally, affecting approximately 970 million people and imposing a heavy burden on patients and their families. Taking Parkinson’s disease as an example, its incidence significantly increases with age. Although traditional drug therapies can alleviate some symptoms, their long-term use leads to diminishing effects and significant side effects.Deep brain stimulation (DBS), delivered via an implantable neurostimulator that targets specific brain regions with electrical stimulation, has significantly improved motor function impairments in patients. One of the core components of the implantable neurostimulator is the charge pump chip, which is responsible for converting low-voltage power sources into high-voltage power to meet the requirements of the stimulation chip. However, traditional testing methods for charge pump chips are inefficient and costly, making it difficult to meet the demands of large-scale production. Therefore, developing an efficient, accurate, and low-cost testing system for charge pump chips is of great significance for ensuring the safety and reliability of implantable neurostimulators.This study provides a detailed investigation of the functional performance testing of the charge pump chip. The functional tests cover five dimensions: voltage multiplication output, pulse frequency, load capacity, power consumption efficiency, and shutdown leakage current. By simulating various operational input conditions, the test results show that all functional indicators of the chip meet the design requirements. Electrostatic discharge (ESD) testing, based on human body models and charged device models, constructs an equivalent circuit, and the results demonstrate that all chip samples comply with ESD protection standards. The functional performance test results of the chip provide critical data support for the development of an automated testing system.To address the inefficiency of traditional testing methods, this study further constructs an automated chip testing system based on an automatic test equipment (ATE). The system integrates pin testing, logic testing, and functional testing processes. Through the use of a category board, precise connections between the chip and testing equipment are achieved, and adjustable resistive loads simulate real working conditions, enabling precise measurements. Compared to traditional manual testing, the testing time per chip is reduced from 25 minutes to 30 seconds, successfully establishing an efficient and accurate automated testing system for charge pump chips, ensuring their safety and reliability in implantable neurostimulators.To reduce testing costs, this paper designs a self-developed automated testing system based on the nRF52832 microcontroller. The hardware part adopts a three-tier power management system (2.3 V/3.3 V/4.1 V) to accommodate different voltage requirements, and uses voltage multiplication and division circuits along with pulse frequency comparators for parameter measurement. The software part constructs an embedded data acquisition system and a PC-based visualization interface, supporting dual modes for both R\&D and production. This solution reduces the cost of a single testing device by approximately 90\%, providing an economical and efficient solution for diverse production needs.This study deeply explores the testing methods for charge pump chips and successfully establishes an automated testing system. The system not only significantly improves testing efficiency but also greatly reduces testing costs, playing an important role in ensuring the safety and reliability of implantable neurostimulators.
